The center of new technologies and its lines of investigation
Authors
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Nomokonova N.N.
Vladivostok State University of Economics and Service
Vladivostok. Russia -
Gavrilov V.Yu.
Vladivostok State University of Economics and Service
Vladivostok. Russia -
Pivovarov D.S.
Vladivostok State University of Economics and Service
Vladivostok. Russia
Abstract
The aspects of the predictive quality inspection for the contemporary microelectronic devices were formulated.
Keywords: informative parameters, marginal voltages, quality inspection.
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